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    ERRATUM: Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

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    Authors
    Reed, Benjamen
    Cant, David
    Spencer, Steve
    Carmona-Carmona, Abraham
    Bushell, Adam
    Herrera-Gómez, Alberto
    Kurokawa, Akira
    Thissen, Andreas
    Thomas, Andrew
    Britton, Andrew
    Bernasik, Andrzej
    Fuchs, Anne
    Baddorf, Arthur
    Bock, Bernd
    Theilacker, Bill
    Cheng, Bin
    Castner, David
    Morgan, David
    Valley, David
    Willneff, Elizabeth
    Smith, Emily
    Nolot, Emmanuel
    Xie, Fangyan
    Zorn, Gilad
    Smith, Graham C.
    Yasufuku, Hideyuki
    Fenton, Jeffrey
    Chen, Jian
    Counsell, Jonathan
    Radnik, Jörg
    Gaskell, Karen
    Artyushkova, Kateryna
    Yang, Li
    Zhang, Lulu
    Eguchi, Makiho
    Walker, Marc
    Hajdyła, Mariusz
    Marzec, Mateusz
    Linford, Matthew
    Kubota, Naoyoshi
    Cortazar-Martínez, Orlando
    Dietrich, Paul
    Satoh, Riki
    Schroeder, Sven
    Avval, Tahereh
    Nagatomi, Takaharu
    Fernandez, Vincent
    Lake, Wayne
    Azuma, Yasushi
    Yoshikawa, Yusuke
    Compean-Gonzalez, Claudia
    Ceccone, Giacomo
    Shard, Alexander
    Show allShow less
    Affiliation
    National Physical Laboratory; CINVESTAV-Unidad Queretaro; Thermo Fisher Scientific (Surface Analysis); National Institute of Advanced Industrial Science and Technology; SPECS Surface Nano Analysis GmbH; University of Manchester; University of Leeds; AGH University of Science and Technology; Robert Bosch GmbH; Oak Ridge National Laboratory; Tascon GmbH; Medtronic; University of Chemical Technology; University of Washington; Cardiff University; Physical Electronics Inc.; University of Leeds; University of Nottingham; CEA-LETI; Sun Yat-sen University; GE Research; University of Chester; National Institute for Materials Science, Japan; Medtronic; Kratos Analytical Ltd; Bundesanstalt für Materialforschung und -prüfung; University of Maryland; Physical Electronics Inc.; Xi’an Jiaotong-Liverpool University; Nippon Steel Technology Co. Ltd; University of Warwick; Brigham Young University; SPECS Surface Nano Analysis GmbH; Asahi Kasei Corporation; Université de Nantes; Atomic Weapons Establishment, Aldermaston; Yazaki Corporation; European Commission Joint Research Centre
    Publication Date
    2021-01-25
    
    Metadata
    Show full item record
    Citation
    Reed, B., Cant, D., Spencer, S., Carmona-Carmona, A., Bushell, A. ... Shard, A. (2021). ERRATUM: Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. Journal of Vacuum Science & Technology A, 39(2), 027001. https://doi.org/10.1116/6.0000907
    Publisher
    American Vacuum Society
    URI
    http://hdl.handle.net/10034/627757
    DOI
    10.1116/6.0000907
    Additional Links
    https://pubs.aip.org/avs/jva/article/39/2/027001/397289/ERRATUM-Versailles-project-on-advanced-materials
    Type
    article
    ISSN
    0734-2101
    ae974a485f413a2113503eed53cd6c53
    10.1116/6.0000907
    Scopus Count
    Collections
    Natural Sciences

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