ERRATUM: Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
Authors
Reed, BenjamenCant, David
Spencer, Steve
Carmona-Carmona, Abraham
Bushell, Adam
Herrera-Gómez, Alberto
Kurokawa, Akira
Thissen, Andreas
Thomas, Andrew
Britton, Andrew
Bernasik, Andrzej
Fuchs, Anne
Baddorf, Arthur
Bock, Bernd
Theilacker, Bill
Cheng, Bin
Castner, David
Morgan, David
Valley, David
Willneff, Elizabeth
Smith, Emily
Nolot, Emmanuel
Xie, Fangyan
Zorn, Gilad
Smith, Graham C.
Yasufuku, Hideyuki
Fenton, Jeffrey
Chen, Jian
Counsell, Jonathan
Radnik, Jörg
Gaskell, Karen
Artyushkova, Kateryna
Yang, Li
Zhang, Lulu
Eguchi, Makiho
Walker, Marc
Hajdyła, Mariusz
Marzec, Mateusz
Linford, Matthew
Kubota, Naoyoshi
Cortazar-Martínez, Orlando
Dietrich, Paul
Satoh, Riki
Schroeder, Sven
Avval, Tahereh
Nagatomi, Takaharu
Fernandez, Vincent
Lake, Wayne
Azuma, Yasushi
Yoshikawa, Yusuke
Compean-Gonzalez, Claudia
Ceccone, Giacomo
Shard, Alexander
Affiliation
National Physical Laboratory; CINVESTAV-Unidad Queretaro; Thermo Fisher Scientific (Surface Analysis); National Institute of Advanced Industrial Science and Technology; SPECS Surface Nano Analysis GmbH; University of Manchester; University of Leeds; AGH University of Science and Technology; Robert Bosch GmbH; Oak Ridge National Laboratory; Tascon GmbH; Medtronic; University of Chemical Technology; University of Washington; Cardiff University; Physical Electronics Inc.; University of Leeds; University of Nottingham; CEA-LETI; Sun Yat-sen University; GE Research; University of Chester; National Institute for Materials Science, Japan; Medtronic; Kratos Analytical Ltd; Bundesanstalt für Materialforschung und -prüfung; University of Maryland; Physical Electronics Inc.; Xi’an Jiaotong-Liverpool University; Nippon Steel Technology Co. Ltd; University of Warwick; Brigham Young University; SPECS Surface Nano Analysis GmbH; Asahi Kasei Corporation; Université de Nantes; Atomic Weapons Establishment, Aldermaston; Yazaki Corporation; European Commission Joint Research CentrePublication Date
2021-01-25
Metadata
Show full item recordCitation
Reed, B., Cant, D., Spencer, S., Carmona-Carmona, A., Bushell, A. ... Shard, A. (2021). ERRATUM: Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. Journal of Vacuum Science & Technology A, 39(2), 027001. https://doi.org/10.1116/6.0000907Publisher
American Vacuum SocietyAdditional Links
https://pubs.aip.org/avs/jva/article/39/2/027001/397289/ERRATUM-Versailles-project-on-advanced-materialsType
articleISSN
0734-2101ae974a485f413a2113503eed53cd6c53
10.1116/6.0000907