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dc.contributor.authorLiu, Xiaoming
dc.contributor.authorGan, Lu
dc.contributor.authorYang, Bin
dc.date.accessioned2021-05-20T16:38:34Z
dc.date.available2021-05-20T16:38:34Z
dc.date.issued2021-05-12
dc.identifierdoi: 10.1016/j.measurement.2021.109472
dc.identifier.citationMeasurement, volume 179, page 109472
dc.identifier.urihttp://hdl.handle.net/10034/624577
dc.descriptionFrom Elsevier via Jisc Publications Router
dc.descriptionHistory: accepted 2021-04-20, epub 2021-05-12, issue date 2021-07-31
dc.descriptionArticle version: AM
dc.descriptionPublication status: Published
dc.description.abstractMillimeter wave technologies have widespread applications, for which dielectric permittivity is a fundamental parameter. The non-resonant free-space measurement techniques for dielectric permittivity using vector network analysis in the millimeter wave range are reviewed. An introductory look at the applications, significance, and properties of dielectric permittivity in the millimeter wave range is addressed first. The principal aspects of free-space millimeter wave measurement methods are then discussed, by assessing a variety of systems, theoretical models, extraction algorithms and calibration methods. In addition to conventional solid dielectric materials, the measurement of artificial metamaterials, liquid, and gaseous-phased samples are separately investigated. The pros of free-space material extraction methods are then compared with resonance and transmission line methods, and their future perspective is presented in the concluding part.
dc.publisherElsevier
dc.rightsLicence for AM version of this article starting on 2022-05-12: http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsEmbargo: ends 2022-05-12
dc.sourceissn: 02632241
dc.titleMillimeter-wave free-space dielectric characterization
dc.typearticle
dc.date.updated2021-05-20T16:38:34Z
dc.date.accepted2021-04-20


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