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dc.contributor.authorReed, Benjamin
dc.contributor.authorCant, David
dc.contributor.authorSpencer, Steve
dc.contributor.authorCarmona-Carmona, Abraham
dc.contributor.authorBushell, Adam
dc.contributor.authorHerrera-Gomez, Alberto
dc.contributor.authorKurokawa, Akira
dc.contributor.authorThissen, Andreas
dc.contributor.authorThomas, Andrew
dc.contributor.authorBritton, Andrew
dc.contributor.authorBernasik, Andrej
dc.contributor.authorFuchs, Anna
dc.contributor.authorBaddorf, Arthur
dc.contributor.authorBock, Bernd
dc.contributor.authorTheilacker, Bill
dc.contributor.authorCheng, Bin
dc.contributor.authorCastner, David
dc.contributor.authorMorgan, David
dc.contributor.authorValley, David
dc.contributor.authorWillneff, Elizabeth
dc.contributor.authorSmith, Emily
dc.contributor.authorNolot, Emmanuel
dc.contributor.authorXie, Fangyan
dc.contributor.authorZorn, Gilad
dc.contributor.authorSmith, Graham C
dc.contributor.authorYasufuku, Hideyuki
dc.contributor.authorFenton, Jeffrey
dc.contributor.authorChen, Jian
dc.contributor.authorCounsell, Jonathan
dc.contributor.authorRadnik, Jorg
dc.contributor.authorGaskell, Karen
dc.contributor.authorArtyushkova, Kateryna
dc.contributor.authorYang, Li
dc.contributor.authorZhang, Lulu
dc.contributor.authorEguchi, Makiho
dc.contributor.authorWalker, Marc
dc.contributor.authorHajddyta, Mariusz
dc.contributor.authorMarzec, Mateusz
dc.contributor.authorLinford, Matthew
dc.contributor.authorKubota, Naoyoshi
dc.contributor.authorCortazar-Martinez, Orlando
dc.contributor.authorDietrich, Paul
dc.contributor.authorSatoh, Riki
dc.contributor.authorSchroeder, Sven
dc.contributor.authorAvval, Tahereh
dc.contributor.authorNagatomi, Takaharu
dc.contributor.authorFernadez, Vincent
dc.contributor.authorLake, Wayne
dc.contributor.authorAzuma, Yasuke
dc.contributor.authorYoshikawa, Yusuke
dc.contributor.authorShard, Alexander
dc.date.accessioned2020-11-25T09:56:14Z
dc.date.available2020-11-25T09:56:14Z
dc.identifierhttps://chesterrep.openrepository.com/bitstream/handle/10034/624008/JVA20-AR-REPROD2020-00405.pdf?sequence=1
dc.identifier.citationReed, B., Cant, D., Spencer, S., Carmona-Carmona, A., Bushell, A. ... Shard, A. (2020). Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. J. Vac. Sci. Technol. A 38, 063208 https://doi.org/10.1116/6.0000577en_US
dc.identifier.urihttp://hdl.handle.net/10034/624008
dc.descriptionThe following article appeared in Reed, B., Cant, D., Spencer, S., Carmona-Carmona, A., Bushell, A. ... Shard, A. (2020). Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. J. Vac. Sci. Technol. A 38, 063208 and may be found at https://doi.org/10.1116/6.0000577. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.en_US
dc.description.abstractWe report the results of a Versailles Project on Advanced Materials and Standards interlaboratory study on the intensity scale calibration of x-ray photoelectron spectrometers using low-density polyethylene (LDPE) as an alternative material to gold, silver, and copper. An improved set of LDPE reference spectra, corrected for different instrument geometries using a quartz-monochromated Al Kα x-ray source, was developed using data provided by participants in this study. Using these new reference spectra, a transmission function was calculated for each dataset that participants provided. When compared to a similar calibration procedure using the NPL reference spectra for gold, the LDPE intensity calibration method achieves an absolute offset of ∼3.0% and a systematic deviation of ±6.5% on average across all participants. For spectra recorded at high pass energies (≥90 eV), values of absolute offset and systematic deviation are ∼5.8% and ±5.7%, respectively, whereas for spectra collected at lower pass energies (<90 eV), values of absolute offset and systematic deviation are ∼4.9% and ±8.8%, respectively; low pass energy spectra perform worse than the global average, in terms of systematic deviations, due to diminished count rates and signal-to-noise ratio. Differences in absolute offset are attributed to the surface roughness of the LDPE induced by sample preparation. We further assess the usability of LDPE as a secondary reference material and comment on its performance in the presence of issues such as variable dark noise, x-ray warm up times, inaccuracy at low count rates, and underlying spectrometer problems. In response to participant feedback and the results of the study, we provide an updated LDPE intensity calibration protocol to address the issues highlighted in the interlaboratory study. We also comment on the lack of implementation of a consistent and traceable intensity calibration method across the community of x-ray photoelectron spectroscopy (XPS) users and, therefore, propose a route to achieving this with the assistance of instrument manufacturers, metrology laboratories, and experts leading to an international standard for XPS intensity scale calibration.en_US
dc.publisherAmerican Vacuum Societyen_US
dc.relation.urlhttps://avs.scitation.org/doi/10.1116/6.0000577en_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.subjectXPSen_US
dc.titleVersailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethyleneen_US
dc.typeArticleen_US
dc.contributor.departmentNational Physical Laboratory; University of Chester; wide range of national and international universities and research institutes (remaining 30 authors)en_US
dc.identifier.journalJournal of Vacuum Science, Techniques and Applicationsen_US
or.grant.openaccessYesen_US
rioxxterms.funderunfundeden_US
rioxxterms.identifier.projectunfundeden_US
rioxxterms.versionAMen_US
rioxxterms.versionofrecordhttps://doi.org/10.1116/6.0000577en_US
rioxxterms.licenseref.startdate2020-11-23
dcterms.dateAccepted2020-10-30
rioxxterms.publicationdate2020-11-23
dc.date.deposited25-11-2020en_US
dc.indentifier.issn0734-2101en_US


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