Mechanism between Material Microstructures and Terahertz Dielectric Properties

Yang, Bin

dc.contributor.author	Yang, Bin
dc.date.accessioned	2020-02-18T09:34:07Z
dc.date.available	2020-02-18T09:34:07Z
dc.date.issued	2019-10-21
dc.identifier.citation	Yang, B. (2019). Mechanism between Material Microstructures and Terahertz Dielectric Properties, 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). France: Paris.	en_US
dc.identifier.uri	http://hdl.handle.net/10034/623187
dc.description.abstract	Significant progress has been made in developing reliable Terahertz (THz) measurement spectroscopy to extract materials’ dielectric properties, however, systematic research on exploring intrinsic mechanism between microstructure of ceramics and THz dielectric properties such as loss, permittivity and dispersive characters has barely started. The paper focuses on one dielectric ceramic system (TiO2), its addition with Zn2SiO4 dielectrics and one hexa-ferromagnetic system to expatiate the association.	en_US
dc.publisher	IEEE	en_US
dc.relation.url	https://ieeexplore.ieee.org/abstract/document/8874342	en_US
dc.rights	CC0 1.0 Universal	*
dc.rights.uri	https://creativecommons.org/licenses/by-nc-nd/4.0/	en_US
dc.title	Mechanism between Material Microstructures and Terahertz Dielectric Properties	en_US
dc.type	Conference Contribution	en_US
dc.contributor.department	University of Chester	en_US
or.grant.openaccess	Yes	en_US
rioxxterms.funder	unfunded	en_US
rioxxterms.identifier.project	unfunded	en_US
rioxxterms.version	AM	en_US
rioxxterms.versionofrecord	https://doi.org/10.1109/IRMMW-THz.2019.8874342	en_US
rioxxterms.licenseref.startdate	2019-10-21
rioxxterms.publicationdate	2019-10-21
dc.dateAccepted	2019-09-01
dc.date.deposited	2020-02-18