Browsing Electronic and Electrical Engineering by Authors
Isolation of a Ferroelectric Intermediate Phase in Antiferroelectric Dense Sodium Niobate CeramicsYang, Bin; Zhang, Hangfeng; Yan, Haixue; Abrahams, Isaac (Elsevier, 2019-08-22)Switchable ferroelectric/antiferroelectric ceramics are of significant interest for high power energy storage applications. Grain size control of this switching is an interesting approach to controlling polarization and hence dielectric properties. However, the use of this approach in technologically relevant ceramics is hindered by difficulty in fabricating dense ceramics with small grain sizes. Here an intermediate polar ferroelectric phase (P21ma) has been isolated in dense bulk sodium niobate ceramics by grain size control through spark plasma sintering methods. Our findings, supported by XRD, DSC, P-E (I-E) loops and dielectric characterization, provide evidence that the phase transition from the antiferroelectric (AFE) R-phase, in space group Pnmm, above 300 C, to the AFE P-phase, in space group Pbma, at room temperature, always involves the polar intermediate P21ma phase and that the P21ma to Pbma transition can be suppressed by reducing grain size.
SrFe12O19 based ceramics with ultra-low dielectric loss in the millimetre-wave bandYu, Chuying; Zeng, Yang; Yang, Bin; Wylde, Richard; Donnan, Robert S.; Wu, Jiyue; Xu, Jie; Gao, Feng; Abrahams, Isaac; Reece, Michael J.; et al. (AIP Publishing, 2018-04-02)Non-reciprocal devices such as isolators and circulators, based mainly on ferromagnetic materials, require extremely low dielectric loss in order for strict power-link budgets to be met for millimetre (mm)-wave and terahertz (THz) systems. The dielectric loss of commercial SrFe12O19 hexaferrite was significantly reduced to below 0.002 in the 75 - 170 GHz band by thermal annealing. While the overall concentration of Fe2+ and oxygen vacancy defects is relatively low in the solid, their concentration at the surface is significantly higher, allowing for a surface sensitive technique such as XPS to monitor the Fe3+/Fe2+ redox reaction. Oxidation of Fe2+ and a decrease in oxygen vacancies is found at the surface on annealing, which is reflected in the bulk sample by a small change in unit cell volume. The significant decrease in dielectric loss property can be attributed to the decreased concentration of charged defects such as Fe2+ and oxygen vacancies through annealing process, which demonstrated that thermal annealing could be effective in improving the dielectric performance of ferromagnetic materials for various applications.