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dc.contributor.authorZeng, Yang*
dc.contributor.authorDonnan, Robert S.*
dc.contributor.authorEdwards, Marc R.*
dc.contributor.authorYang, Bin*
dc.date.accessioned2018-01-29T10:03:11Z
dc.date.available2018-01-29T10:03:11Z
dc.date.issued2017-10-16
dc.identifier.citationZeng, Y., Donnan, R., Edwards, M. & Yang, B. (2017-September). Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technology. Millimetre Waves and Terahertz Technologies (UCMMT), 2017 10th UK-Europe-China Workshop. IEEE Conference Publications.en
dc.identifier.isbn9781538627204
dc.identifier.doi10.1109/UCMMT.2017.8068504
dc.identifier.urihttp://hdl.handle.net/10034/620827
dc.description© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en
dc.description.abstractIn this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
dc.language.isoenen
dc.publisherIEEE Conference Publicationsen
dc.relation.urlhttp://ieeexplore.ieee.org/document/8068504/en
dc.rights.urihttp://ieeexplore.ieee.org/abstract/document/8068504/en
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectTHz sensingen
dc.subjectspectroscopyen
dc.subjectnear field scanning imagingen
dc.subjectprinted electronicsen
dc.titleQuality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technologyen
dc.typeArticleen
dc.contributor.departmentUniversity of Chesteren
dc.identifier.journalMillimetre Waves and Terahertz Technologies (UCMMT), 2017 10th UK-Europe-China Workshop
or.grant.openaccessYesen
rioxxterms.funderEPSRC Centre for Innovative Manufacturing in Large Area Electronicsen
rioxxterms.identifier.projectEPSRC Centre for Innovative Manufacturing in Large Area Electronics (EP/K03099X/1).en
rioxxterms.versionAMen
rioxxterms.licenseref.startdate2017-10-16
html.description.abstractIn this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
rioxxterms.publicationdate2017-10-16
dc.dateAccepted2017-10-16
dc.date.deposited2018-01-29


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