Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technology

Thumbnail
Name:
UCMMT2017_Fullpaper_submission.pdf
Embargo:
2217-10-16
Size:
248.5Kb
Format:
PDF
Description:
accepted article
Download
Authors
Zeng, Yang
Donnan, Robert S.
Edwards, Marc R.
Yang, Bin
Affiliation
University of Chester
Publication Date
2017-10-16

Metadata
Show full item record
Abstract
In this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
Citation
Zeng, Y., Donnan, R., Edwards, M. & Yang, B. (2017-September). Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technology. Millimetre Waves and Terahertz Technologies (UCMMT), 2017 10th UK-Europe-China Workshop. IEEE Conference Publications.
Publisher
IEEE Conference Publications
Journal
Millimetre Waves and Terahertz Technologies (UCMMT), 2017 10th UK-Europe-China Workshop
URI
http://hdl.handle.net/10034/620827
DOI
10.1109/UCMMT.2017.8068504
Additional Links
http://ieeexplore.ieee.org/document/8068504/
Type
Article
Language
en
Description
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
ISBN
9781538627204
Collections

The following license files are associated with this item:

  • Creative Commons