• Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz Technology

      Zeng, Yang; Donnan, Robert S.; Edwards, Marc R.; Yang, Bin; University of Chester (IEEE Conference Publications, 2017-10-16)
      In this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
    • SrFe12O19 based ceramics with ultra-low dielectric loss in the millimetre-wave band

      Yu, Chuying; Zeng, Yang; Yang, Bin; Wylde, Richard; Donnan, Robert S.; Wu, Jiyue; Xu, Jie; Gao, Feng; Abrahams, Isaac; Reece, Michael J.; et al. (AIP Publishing, 2018-04-02)
      Non-reciprocal devices such as isolators and circulators, based mainly on ferromagnetic materials, require extremely low dielectric loss in order for strict power-link budgets to be met for millimetre (mm)-wave and terahertz (THz) systems. The dielectric loss of commercial SrFe12O19 hexaferrite was significantly reduced to below 0.002 in the 75 - 170 GHz band by thermal annealing. While the overall concentration of Fe2+ and oxygen vacancy defects is relatively low in the solid, their concentration at the surface is significantly higher, allowing for a surface sensitive technique such as XPS to monitor the Fe3+/Fe2+ redox reaction. Oxidation of Fe2+ and a decrease in oxygen vacancies is found at the surface on annealing, which is reflected in the bulk sample by a small change in unit cell volume. The significant decrease in dielectric loss property can be attributed to the decreased concentration of charged defects such as Fe2+ and oxygen vacancies through annealing process, which demonstrated that thermal annealing could be effective in improving the dielectric performance of ferromagnetic materials for various applications.
    • Terahertz Characterisation of UV Offset Lithographically Printed Electronic-Ink

      Zeng, Yang; Edwards, Marc R.; Stevens, Robert; Bowen, John; Donnan, Robert S.; Yang, Bin; University of London; National University of Defense Technology; University of Chester; Nottingham Trent University; University of Reading (Elsevier, 2017-06-10)
      Inkjet-printed electronics are showing promising potential in practical applications, but methods for real-time, non-contact monitoring of printing quality are lacking. This work explores Terahertz (THz) sensing as an approach for such monitoring. It is demonstrated that alterations in the localised dielectric characteristics of inkjet-printed electronics can be qualitatively distinguished using quasi-optically-based, sub-THz reflection spectroscopy. Decreased reflection coefficients caused by the sintering process are observed and quantified. Using THz near-field scanning imaging, it is shown that sintering produces a more uniform spatial distribution of permittivity in the printed carbon patterns. Images generated using THz-TDS based imaging are presented, demonstrating the combination of high resolution imaging with quantification of complex permittivities. This work, for the first time, demonstrates the feasibility of quality control in printed electronic-ink with THz sensing, and is of practical significance to the development of in-situ and non-contact commercial-quality characterisation methods for inkjet-printed electronics.
    • Titanium Dioxide Engineered for Near-dispersionless High Terahertz Permittivity and Ultra-low-loss

      Chuying, Yu; Zeng, Yang; Yang, Bin; Donnan, Robert S.; Huang, Jinbao; Xiong, Zhaoxian; Mahajan, Amit; Shi, Baogui; Ye, Haitao; Binions, Russell; et al. (Nature Publishing Group, 2017-07-26)
      Realising engineering ceramics to serve as substrate materials in high-performance terahertz(THz) that are low-cost, have low dielectric loss and near-dispersionless broadband, high permittivity, is exceedingly demanding. Such substrates are deployed in, for example, integrated circuits for synthesizing and converting nonplanar and 3D structures into planar forms. The Rutile form of titanium dioxide (TiO2) has been widely accepted as commercially economical candidate substrate that meets demands for both low-loss and high permittivities at sub-THz bands. However, the relationship between its mechanisms of dielectric response to the microstructure have never been systematically investigated in order to engineer ultra-low dielectric-loss and high value, dispersionless permittivities. Here we show TiO2 THz dielectrics with high permittivity (ca. 102.30) and ultra-low loss (ca. 0.0042). These were prepared by insight gleaned from a broad use of materials characterisation methods to successfully engineer porosities, second phase, crystallography shear-planes and oxygen vacancies during sintering. The dielectric loss achieved here is not only with negligible dispersion over 0.2 - 0.8 THz, but also has the lowest value measured for known high-permittivity dielectrics. We expect the insight afforded by this study will underpin the development of subwavelength-scale, planar integrated circuits, compact high Q-resonators and broadband, slow-light devices in the THz band.