Browsing Electronic and Electrical Engineering by Authors
Bacillus Spores and Their Relevant Chemicals Studied by Terahertz Time Domain SpectroscopyTang, Jianhua; Yang, Bin; Llewellyn, Ian; Cutler, Ronald R.; Donnan, Robert S.; Queen Mary University of London; University of Bolton (Elsevier, 2013-12-28)Terahertz Time Domain Spectroscopy has been used to investigate 0.2 to 2.2 terahertz (THz) transmission responses of Bacillus spores and their related chemical components. Whilst no THz signatures could be clearly associated with either sporulated cells or their chief chemical components, differing degrees of signal attenuation and frequency-dependent light scattering were observed depending on spore composition and culture media. The observed monotonic increase in absorption by spores over this THz spectral domain is mainly from Mie scattering and also from remnant water bound to the spores.
Quality Mapping of Offset Lithographic Printed Antenna Substrates and Electrodes by Millimeter-Wave ImagingZhang, Jiao; Tang, Jianhua; Sun, Wenfeng; Zhang, Yan; Yang, Bin; Wang, Xinke; University of Chester (MDPI, 2019-06-14)Offset lithographic printed flexible antenna substrate boards and electrodes have attracted much attention recently due to the boost of flexible electronics. Unmanned quality inspection of these printed substrate boards and electrodes demands high-speed, large-scale and nondestructive methods, which is highly desired for manufacturing industries. The work here demonstrates two kinds of millimeter (mm)-wave imaging technologies for the quality (surface uniformity and functionality parameters) inspection of printed silver substrates and electrodes on paper and thin polyethylene film, respectively. One technology is a mm-wave line scanner system and the other is a terahertz-time domain spectroscopy-based charge-coupled device (CCD) imaging system. The former shows the ability of detecting transmitted mm-wave amplitude signals only; its detection is fast in a second time scale and the system shows great potential for the inspection of large-area printed surface uniformity. The latter technology achieves high spatial resolution images of up to hundreds of micrometers at the cost of increased inspection time, in a time scale of tens of seconds. With the exception of absorption rate information, the latter technology offers additional phase information, which can be used to work out 2D permittivity distribution. Moreover, its uniformity is vital for the antenna performance. Additionally, the results demonstrate that compression rolling treatment significantly improves the uniformity of printed silver surfaces and enhances the substrate’s permittivity values.
Terahertz reading of ferroelectric domain wall dielectric switchingZhang, Man; Chen, Zhe; Yue, Yajun; Chen, Tao; Yan, Zhongna; Jiang, Qinghui; Yang, Bin; Eriksson, Mirva; Tang, Jianhua; Zhang, Dou; et al.Ferroelectric domain walls (DWs) are important nano scale interfaces between two domains. It is widely accepted that ferroelectric domain walls work idly at terahertz (THz) frequencies, consequently discouraging efforts to engineer the domain walls to create new applications that utilise THz radiation. However, the present work clearly demonstrates the activity of domain walls at THz frequencies in a lead free Aurivillius phase ferroelectric ceramic, Ca0.99Rb0.005Ce0.005Bi2Nb2O9, examined using THz time domain spectroscopy (THz-TDS). The dynamics of domain walls are different at kHz and THz frequencies. At low frequencies, domain walls work as a group to increase dielectric permittivity. At THz frequencies, the defective nature of domain walls serves to lower the overall dielectric permittivity. This is evidenced by higher dielectric permittivity in the THz band after poling, reflecting decreased domain wall density. An elastic vibrational model has also been used to verify that a single frustrated dipole in a domain wall represents a weaker contribution to the permittivity than its counterpart within a domain. The work represents a fundamental breakthrough in understanding dielectric contributions of domain walls at THz frequencies. It also demonstrates that THz probing can be used to read domain wall dielectric switching.