Browsing Electronic and Electrical Engineering by Authors
Quality-Control of UV offset Lithographicaly Printed Electronic-Ink by THz TechnologyZeng, Yang; Donnan, Robert S.; Edwards, Marc R.; Yang, Bin; University of Chester (IEEE Conference Publications, 2017-10-16)In this paper, a novel quality-monitor method of inkjet-printed electronics based on terahertz (THz) sensing is presented. Specifically, two different approaches, namely THz reflection spectroscopy and THz near-field scanning, are proposed.
Terahertz Characterisation of UV Offset Lithographically Printed Electronic-InkZeng, Yang; Edwards, Marc R.; Stevens, Robert; Bowen, John; Donnan, Robert S.; Yang, Bin; University of London; National University of Defense Technology; University of Chester; Nottingham Trent University; University of Reading (Elsevier, 2017-06-10)Inkjet-printed electronics are showing promising potential in practical applications, but methods for real-time, non-contact monitoring of printing quality are lacking. This work explores Terahertz (THz) sensing as an approach for such monitoring. It is demonstrated that alterations in the localised dielectric characteristics of inkjet-printed electronics can be qualitatively distinguished using quasi-optically-based, sub-THz reflection spectroscopy. Decreased reflection coefficients caused by the sintering process are observed and quantified. Using THz near-field scanning imaging, it is shown that sintering produces a more uniform spatial distribution of permittivity in the printed carbon patterns. Images generated using THz-TDS based imaging are presented, demonstrating the combination of high resolution imaging with quantification of complex permittivities. This work, for the first time, demonstrates the feasibility of quality control in printed electronic-ink with THz sensing, and is of practical significance to the development of in-situ and non-contact commercial-quality characterisation methods for inkjet-printed electronics.