Browsing Faculty of Science and Engineering by Title
Now showing items 605-607 of 607
The X-ray photoelectron spectroscopy of surface films formed during the ASTM D-130/ISO 2160 copper corrosion testThe surfaces of ISO 2160 copper strips tested in iso-octane with elemental sulfur, aliphatic, cyclic and aromatic thiols, diphenyl sulfide, and diphenyl disulfide individually or in combination were studied using XPS. Aliphatic thiols bonded through the sulfur, whereas elemental sulfur formed a cuprous sulfide layer. Aromatics bonded partially through the sulfur with the rings oriented horizontally due to π orbital interactions, accounting in part for their inhibitory effects in the test. The test rating was not directly related to the sulfur concentration in solution or on the surface, and certain combinations of species resulted in higher levels of sulfur at the surface than found individually.
XPS Analysis of the chemical degradation of PTB7 polymers for organic photovoltaicsThe chemical degradation of the Poly[[4,8-bis[(2-ethylhexyl)oxy]benzo[1,2-b:4,5-b']dithiophene-2,6-diyl][3-fluoro-2-[(2-ethylhexyl)carbonyl]thieno[3,4-b]thiophenediyl]] or ‘ PTB7’ has been studied using X-ray Photoelectron Spectroscopy (XPS). This material system appears to be intrinsically unstable especially when illuminated in air and XPS studies confirm the rapid photo-degradation is related to changes in chemical structure of the polymer. In particular, XPS spectra show an initial reduction in relative C-C intensity, suggests loss of the alkoxy side chains. This is followed by a dramatic increase in the level of oxygen-bonded species, especially C-O at ~286.5 eV and C(=O)O at 289.2 eV, indicative of COOH and OH group formation, and oxidation of S. The XPS results support the view that using processing additives reduces the chemical stability of the polymer and provides insight into strategies to improve molecular design to ensure higher chemical stability.