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Chemical and device degradation in PCPDTBT: PCBM solar cells using XPS and ToF-SIMS
Kettle, Jeff Waters, Huw Ding, Ziqian Smith, Graham C.
Kettle, Jeff
Waters, Huw
Ding, Ziqian
Smith, Graham C.
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2015-04-20
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poster
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Analysis of the degradation routes for PCPDTBT-based solar cells under illumination and in the presence of air have been conducted using a combination of X-ray Photoelectron Spectroscopy (XPS), Time-Of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and solar cell device data. After ageing, XPS studies show that PCPDTBT appears as an oxygen-containing polymer, with data indicating that a break-up in the aromatic rings, formation of sulphates at the thiophene ring, chain scission in the polymer backbone and also loss of side chains. XPS studies on active layers blends of PCPDTBT and PCBM also show significant changes in the vertical composition during ageing, with increased enrichment of PCPDTBT observed at the top surface and that the use of a processing additive (ODT) has a negative impact
on the morphological stability. TOF-SIMS has been used to study electrode degradation during ageing experiments leads to migration of indium and tin ions into the active layer in non-inverted devices, but is eliminated for inverted devices.
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Poster presentation given at the Printed photovoltaics: From materials to manufacture conference at University of Swansea, 20-21 April 2015.
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Presentation
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en
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RAEng and EC financial support and Prof TJ Lewis (Bangor) for technical support