The X-ray photoelectron spectroscopy of surface films formed during the ASTM D-130/ISO 2160 copper corrosion test

Hdl Handle:
http://hdl.handle.net/10034/315462
Title:
The X-ray photoelectron spectroscopy of surface films formed during the ASTM D-130/ISO 2160 copper corrosion test
Authors:
Reid, David G.; Smith, Graham C.
Abstract:
The surfaces of ISO 2160 copper strips tested in iso-octane with elemental sulfur, aliphatic, cyclic and aromatic thiols, diphenyl sulfide, and diphenyl disulfide individually or in combination were studied using XPS. Aliphatic thiols bonded through the sulfur, whereas elemental sulfur formed a cuprous sulfide layer. Aromatics bonded partially through the sulfur with the rings oriented horizontally due to π orbital interactions, accounting in part for their inhibitory effects in the test. The test rating was not directly related to the sulfur concentration in solution or on the surface, and certain combinations of species resulted in higher levels of sulfur at the surface than found individually.
Affiliation:
University of Chester
Citation:
Petroleum Science and Technology, 2014, 32(4), pp. 387-394
Publisher:
Taylor & Francis
Journal:
Petroleum Science and Technology
Publication Date:
Jan-2014
URI:
http://hdl.handle.net/10034/315462
DOI:
10.1080/10916466.2011.588635
Additional Links:
http://www.tandfonline.com/toc/lpet20/current
Type:
Article
Language:
en
Description:
This is an Author’s Accepted Manuscript of an article published in Petroleum Science & Technology [Volume 32, Issue 4, 2014 ], available online: http://www.tandfonline.com/10.1080/10916466.2011.588635
ISSN:
1091-6466; 1532-2459
Appears in Collections:
Natural Sciences

Full metadata record

DC FieldValue Language
dc.contributor.authorReid, David G.en
dc.contributor.authorSmith, Graham C.en
dc.date.accessioned2014-04-07T13:14:06Zen
dc.date.available2014-04-07T13:14:06Zen
dc.date.issued2014-01en
dc.identifier.citationPetroleum Science and Technology, 2014, 32(4), pp. 387-394en
dc.identifier.issn1091-6466en
dc.identifier.issn1532-2459en
dc.identifier.doi10.1080/10916466.2011.588635en
dc.identifier.urihttp://hdl.handle.net/10034/315462en
dc.descriptionThis is an Author’s Accepted Manuscript of an article published in Petroleum Science & Technology [Volume 32, Issue 4, 2014 ], available online: http://www.tandfonline.com/10.1080/10916466.2011.588635en
dc.description.abstractThe surfaces of ISO 2160 copper strips tested in iso-octane with elemental sulfur, aliphatic, cyclic and aromatic thiols, diphenyl sulfide, and diphenyl disulfide individually or in combination were studied using XPS. Aliphatic thiols bonded through the sulfur, whereas elemental sulfur formed a cuprous sulfide layer. Aromatics bonded partially through the sulfur with the rings oriented horizontally due to π orbital interactions, accounting in part for their inhibitory effects in the test. The test rating was not directly related to the sulfur concentration in solution or on the surface, and certain combinations of species resulted in higher levels of sulfur at the surface than found individually.en
dc.language.isoenen
dc.publisherTaylor & Francisen
dc.relation.urlhttp://www.tandfonline.com/toc/lpet20/currenten
dc.rightsArchived with thanks to Petroleum Science and Technologyen
dc.subjectcopperen
dc.subjectcorrosionen
dc.subjectISO 2160en
dc.subjectXPSen
dc.subjectsurfaceen
dc.titleThe X-ray photoelectron spectroscopy of surface films formed during the ASTM D-130/ISO 2160 copper corrosion testen
dc.typeArticleen
dc.contributor.departmentUniversity of Chesteren
dc.identifier.journalPetroleum Science and Technologyen
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